Second-hand equipment

JNM-ECZS400 Spectrometer

The compact efficiency class of NMR instruments with 400 Hz.

 

Additional information can be found here

 

Features

With over 60 years of experience, JEOL is the oldest NMR manufacturer in the world. JEOL instruments are among the fastest, most stable, reliable, and robust devices available on the market. With the JNM-ECZS400, JEOL not only offers the world’s most compact NMR spectrometer but also an award-winning one.

The device, including console and magnet, with Royal HFX probe & autosampler for 30 samples, is currently available at a preferential price.

• High-performance spectrometer in a compact, award-winning design
• Valid analysis of solid and liquid samples
• 43% reduced floor area of the main chassis compared to similar instruments
• Highly sensitive auto-tune probes
• State-of-the-art superconducting magnet with minimal stray fields and drift rates
• Highly reliable hardware + modern software + premium service = your optimised workflow

If you are interested or have further questions about a possible use in your laboratory, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!

 

JSM-IT200 Scanning Electron Microscope

Versatile, high throughput SEM from JEOL combined with the intuitive operation of a table-top SEM.

 

Additional information can be found here

 

Features

The InTouchScope JSM-IT200 features all the capabilities of a full size tungsten SEM with integrated EDS analysis in a small, ergonomic and intuitive design. It is very easy to install since neither cooling water nor gas is necessary.

Practical features for users of all levels:

• high resolution imaging in HV/LV/SE/BSE
• Zeromag-mode for intuitive transition from light-optic to SEM image
• chemical analysis with optional integrated EDS and live analysis
• multi-touch screen control and wireless operation
• automatic SEM condition setup based on sample type
• simultaneous multiple live image and movie capture
• fast sample navigation at 5x – 300,000x magnifications
• Smile View Premium Offline-Software with image sharpening, montaging, position alignment and overlay
• Compact floor space: ca. 0,5m²

If you are interested or have further questions about a possible use in your laboratory, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!

 

JSM-IT700HR Scanning Electron Microscope

Built off of the highly successful predecessor of our InTouchScope™ series SEMs, the JSM-IT700HR was developed to meet increasing demands in the market place. This SEM breaks through the conventional general-purpose SEM in terms of high resolution imaging and high spatial-resolution analysis, by incorporating a high-brightness electron gun.

 

Additional information can be found here

 

Features

Increase your productivity with our fully-integrated software, from specimen navigation to analysis to report creation.

• Zeromag function links holder graphics, CCD and SEM images to simplify sample navigation.
• Live Analysis, our embedded EDS system, shows real time EDS spectra during image observation for efficient elemental analysis.
• SMILE VIEW™ Lab, enabling integrated management of image and analysis data, facilitates report generation for all data.
• Specimen Exchange Navi enables safe and simple specimen exchange.
• With the newly-developed Auto Beam Alignment function, the electron optical conditions are always kept optimum.
• Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
• Compact design with small footprint.

If you are interested or have further questions about a possible use in your laboratory, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!

 

 

JSM-IT800SHL Scanning Electron Microscope

The field emission scanning electron microscope JSM-IT800SHL uniquely combines the highest resolution and versatility with intuitive handling and extensive automation."

 

 

Features

The JSM-IT800SHL covers a wide range of applications and allows for an easy entry into the world of high-resolution field emission scanning electron microscopy.

• Highest resolution imaging and analysis, even for magnetic or insulating materials, using a Super Hybrid Lens (SHL)..
• Extremely fast analysis with a high specimen current of ≥ 300 nA.
• Maximum stability and continuously adjustable current through the in-lens Schottky Plus field emission electron source and the dual condenser lens system.
• Quick transitions between different operating modes through the new "NeoEngine" and improved auto-functions.
• Extreme depth of field and distortion-free imaging of large sample structures through unique lens optics.
• Fast and safe exchange of large specimens through the specimen chamber.
• Stepless transition between optical and SEM imaging for the easiest sample navigation using the JEOL ZeroMag function.
• New backscattered electron detectors enable customized, application-optimized configuration of the system, such as a flexible 6-segment detector or a highly sensitive scintillator detector.
• Live functions include live EDX analyses and live EDX mappings.
• Full integration of the JEOL EDX system, including live EDX for maximum user comfort and intuitive reporting of all recorded measurement data. In addition to conventional EDX detectors with windows, JEOL also offers its own geometry-optimized and windowless EDX detector ("Gather-X") for analyses of light elements and high-speed mappings.
• For the examination of non-conductive materials, a flexible low-vacuum system is available at the push of a button.

If you are interested or have further questions about the potential use in your laboratory, please contact us at slsjld or use our contact form. We are also happy to offer the appropriate service contract for our used equipment.
We look forward to your inquiry!

 

 

JSM-IT800is Scanning Electron Microscope

The JSM-IT800is Field Emission Scanning Electron Microscope uniquely combines exceptional resolution and versatility with intuitive handling and extensive automation. As such, the JSM-IT800is spans a broad range of applications and provides an effortless entry into the realm of ultra-high-resolution field emission scanning electron microscopy.

 

 

Features

The JSM-IT800is covers a wide range of applications and allows for an easy entry into the world of high-resolution field emission scanning electron microscopy.

• Extremely fast analysis with a high specimen current of ≥ 300 nA.
• Unmatched stability and continuously adjustable current, achieved through the in-lens Schottky Plus field emission electron source and the dual condenser lens system.
• Rapid transitions between different operating modes enabled by the new "NeoEngine" and enhanced autofunctions.
• Exceptional depth of field and distortion-free imaging of large sample structures, facilitated by unique lens optics.
• Seamless transition between optical and SEM imaging for the simplest sample navigation, enabled by the JEOL ZeroMag function.
• New backscattered electron detectors allow for a tailored, application-optimized configuration of the system, such as with a flexible 6-segment detector or a highly sensitive scintillator detector.
• Live functions include live EDX analysis and live EDX mapping.
• Full integration of the JEOL EDX system, including live EDX, for maximum user convenience and intuitive reporting of all recorded measurement data.
• For the examination of non-conductive materials, a flexible low-vacuum system is available at the push of a button.

If you are interested or have further questions about the potential use in your laboratory, please contact us at slsjld or use our contact form. We are also happy to offer the appropriate service contract for our used equipment.
We look forward to your inquiry!

 

 

JCM-7000 Table-top Scanning Electron Microscope

Innovative desktop scanning electron microscope with a fully hard- and software-integrated energy-dispersive X-ray spectrometer (EDS) including a low-vacuum mode for non-conductive samples. Fully functional setup from our applications laboratory.

 

Additional information can be found here

 

Features

• “Live 3D”: real-time SEM image and reconstructed 3D surface for simultaneous acquisition of topographic depth information and surface fine structures.
• Full-featured electron optics for magnifications up to x100,000. Straightforward emitter change provided by pre-centered tungsten filaments.
• Automatic condition setting based on sample type and application ensures high quality results and enhances productivity.
• JEOL ZeroMag for seamless transition between light optical & SEM imaging dramatically improves handling and through-put.
• Fully integrated JEOL EDS system including live EDS for maximum ease of use and comprehensive report generation.
• Automated acquisition of SEM images and elemental distribution maps resulting in high resolution montages.
• Challenging samples can be investigated in low-vacuum mode with the push of a button.
• Large chamber for samples of up to 80 mm diameter and 50 mm height.
• Simple installation – an electric socket and you are ready to go!
• Compact design for mobile applications.

If you are interested or have further questions about a possible use in your laboratory, please contact us at slsjld or use our contact form. We are happy to offer the appropriate service contract for our used equipment as well.
We look forward to your inquiry!